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On 3/9/2015 9:29 AM, Brian Reay wrote:
On 08/03/2015 23:42, rickman wrote: On 3/8/2015 6:06 PM, Brian Reay wrote: On 08/03/15 19:58, rickman wrote: On 3/8/2015 3:31 PM, Brian Reay wrote: On 08/03/15 18:46, rickman wrote: On 3/8/2015 9:53 AM, Brian Reay wrote: Jerry Stuckle wrote: On 3/8/2015 7:35 AM, Brian Reay wrote: Jeff wrote: I will finally point out that your use of the term "slope detecting ADC" is invalid. Google returns exactly 4 hits when this term is entered with quotes. The name of this converter may have slope in it, but that is because the circuit generates a slope, not because it is detecting a slope. Please look up the circuit and use a proper name for it such as integrating ADC or dual slope ADC. The integrating converter is not at all sensitive to the slope of the input signal, otherwise it would not be able to measure a DC signal which has a slope of zero. I'm only replying so that others are not confused by your misstatements. He is probably referring to a CVSD, otherwise known as a Delta Modulator. Jeff I don't think so. In fact, I have to say Jerry seems a bit confused in this particular area, perhaps I have missed something. ADC tend to have a sample and hold prior to the actual ADC convertor, thus the value converted is that at the beginning of the sample period OR if another approach to conversion is used, you get some kind of average over the conversion period. (There are other techniques but those are the main ones.) If you think about, a S/H is required if the rate of change of the input signal means it can change by 1/2 lsb during the conversion time for a SAR ADC. This limits the overall BW of the ADC process. (I recall spending some time convincing a 'seat of the pants engineer' of this when his design wouldn't work. Even when he adopted the suggested changes he insisted his design would have worked if the ADC was more accurate. In fact, it would have made it worse.) No, Brian, I am not confused. It is a form of delta modulation, but is used in an ADC. Two samples are taken, 2 or more times the sample rate (i.e. if the sample rate were 20us, the first sample would be taken every 20us, with the second sample following by 10us or less). The difference is converted to a digital value for transmission. On the other end, the reverse happens. Yes, the signal can change by 1/2 lsb - but that's true of any ADC. For any sufficiently high sample rate (i.e. 3x input signal or more), this method is never less accurate than a simple voltage detecting ADC, and in almost every case is more accurate. However, it is a more complex circuit (on both ends), samples a much smaller analog value and requires more exacting components and a higher cost (which is typically the case for any circuit improvements). As I said - we studied them in one of my EE coursed back in the 70's. I played with them for a while back then, but at the time the ICs were pretty expensive for a college student. Ok Jerry. You can, of course, find the rate of change (slope) by that method if you know ( or assume) the signal is either only increasing or decreasing between the samples. (A Nyquist matter). However, the 1/2 lsb matter I mentioned is more for during the conversion, rather that for different samples. It is particularly important for slower ADC types, such as SAR implementations. Can you explain your 1/2 lsb effect? What type of ADC are you referring to? Different ADC types do require a S/H on the input for signals that are not *highly* oversampled. For example a flash converter can mess up and be quite a bit off if the signal is slewing during conversion. Same with SAR converters. But I don't know of any effect where 1/2 lsb is a threshold. What threshold would you expect? As I recall, 1/2 lsb is the limit to ensure that the conversion would be the 'same' over the conversion time. I'm not sure what you mean by "the conversion would be the 'same' over the conversion time", but I don't see how 1/2 lsb is any magic threshold. If you are working with a flash converter, there are a number of comparators each with a different threshold. The input signal could be right at the edge of one of these thresholds so that a very tiny change in the input signal will cause that threshold to be crossed during the conversion. Maybe I'm not understanding your point. Sorry, I was referring to SAR converters. I should have been more precise. With an SAR converter, if the signal changes during the conversion period, then the converter will fail (at best)*, if the change is more than 1/2 lsb. Therefore, the signal must remain constant (within 1/2 lsb) for the period of the conversion. If the maximum rate of change of signal is known to be such that this will be the case, all is well, if not, you need a sample and hold. You sample the signal, convert the sample, and repeat the process for the next sample. The S/H is designed to minimise the sampling time while ensuring the required hold time is maintained- ie the sample stays within the required 1/2 lsb for the conversion period. Of course, some SAR ADCs have the S/H incorporated within the device, others require either an external one or have provision for the C to be external to permit design flexibility. I understand what you are describing, but you still have not explained the basis of the 1/2 lsb threshold. In an SAR converter the thresholds are still fixed. So the amount of room for noise depends on the value of the signal. If the signal is 1/4 of an lsb from the next conversion threshold then 1/4 lsb of noise will cause a wrong reading. If the signal is within 0.001 lsb of the threshold then 0.001 lsb of change in the signal will cause an error. 1/2 lsb is resolution of the ADC, any reading can never be certain to be any closer than this. You don't really want your sample changing by more than this during the conversion process. If you don't believe me, I suggest you look at some application notes on SAR ADCs, this is standard stuff. That's not an explanation. But whatever. Thanks -- Rick |
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